Associate Professor of Physics and Materials Science
Director, Southeastern North Carolina Regional Microanalytical and Imaging Consortium (SENCR-MIC)
Director, Interdisciplinary Materials Research and Education Laboratory (IMREL)
Fayetteville, NC 28301
E-mail: firstname.lastname@example.orgResearch Website: http://zluo.fsufaculty.uncfsu.edu/
Fabrication of novel nanostructured materials with enhanced performance for energy-related applications; Material structures through electron microscopy; Material structure-property correlations.
|Dalian Jiaotong University, China||Mater. Sci. Eng.||B.E. (1987)|
|Southwest Jiaotong University, China||Mater. Sci. Eng.||M.S.E. (1990)|
|Chinese Aeronautical Establishment, Beijing, China||Mater. Sci. Eng.||Ph.D. (1994)|
|Okayama University of Science, Japan||Electron Microscopy of Materials||Postdoc., 03/18/1996 - 12/24/1997|
|Associate Professor and SENCR-MIC Director (08/2012-present)||Fayetteville State University|
|Associate Member of the Graduate Faculty (11/2010- 07/2012)||Materials Science and Engineering Program, Texas A&M University|
|Research Scientist (07/2001-07/2012)||Microscopy and Imaging Center, Texas A&M University|
|Assistant Scientist (Grade 705) (02/2001-07/2001)||Materials Science Division, Argonne National Laboratory|
|Visiting Scholar (02/1998-02/2001)||Materials Science Division, Argonne National Laboratory|
|Postdoctoral Researcher (03/1996 - 12/1997)||Department of Mechanical Engineering, Okayama University of Science, Japan|
|Research Engineer (05/1994 - 03/1996)||Department of Metal Physics, Beijing Institute of Aeronautical Materials, China|
|Assistant Research Engineer (11/1993 - 05/1994)||Department of Metal Physics, Beijing Institute of Aeronautical Materials, China|
Articles in peer-reviewed journals: >220; conference proceedings: > 60; citations: >4,600; h-index: 37.
· User, Electron Microscopy Center, Nanoscience and Technology Division, Argonne National Laboratory;
· Member, ASM International;
· Member, International Metallographic Society;
· Member, Microscopy Society of America.